Arbeitskreis Modellierung von Systemen und
Parameterextraktion Modeling of Systems and Parameter Extraction Working Group 11th International MOS-AK Workshop (co-located with the IEDM and CMC Meetings) Silicon Valley, December 5, 2018 |
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MOS-AK Technical
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Important Dates: |
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Venue: |
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Agenda |
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9:00-12:00 | MOS-AK Morning Session Chair: W. Grabinski, MOS-AK (EU) |
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T_0 |
Workshop Opening and MOS-AK Overview Bogdan Tudor, Silvaco (US) and Wladek Grabinski, MOS-AK (EU) |
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T_1 |
Silvaco
GaN HEMT Compact Modeling
Perspective Bogdan Tudor, Colin Shaw and Sungwon Kong Silvaco (US) |
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T_2 |
GaN
HEMT Devices and Modeling for
Operational Electronics at Harsh Environments Saleh Kargarrazi XLab, Stanford (US) |
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Coffee Break | ||||||
T_3 |
Impact
of Basal Plane Dislocations and
Ruggedness of 10 kV 4H-SiC Transistors Victor Veliadis, Ashish Kumar, Sanket Parashar, and Subhashish Bhattacharya PowerAmerica/NCSU (US) |
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T_4 |
Direct
measurement of white noise in
MOSFETs Kenji Ohmori* and Shuhei Amakawa*,** *Device Lab Inc., **Hiroshima University (J) |
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12:00-13:00 | Lunch Break | |||||
Late News |
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13:00-16:00 | MOS-AK Afternoon Session Chair: Bogdan Tudor, Silvaco |
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T_5 |
NEREID
Technology Roadmap Enrico Sangiorgi NEREID; uni. Bologna (I) |
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T_6 |
A
physics-based compact model of RRAM for
emerging applications Francesco M. Puglisi, Paolo Pavan DIEF, University of Modena and Reggio Emilia (I) |
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Coffee Break | ||||||
T_7 |
From
Physics to Power, Performance, and
Parasitics Zlatan Stanojevic, Oskar Baumgartner, Franz Schanovsky, Ferdinand Mitterbauer, Georg Strof, Christian Kernstock, Markus Karner Global TCAD Solutions GmbH (A) |
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T_8 |
MOS-AK
FOSS Compact Modeling Perspective Wladek Grabinski, IEEE EDS DL MOS-AK (EU) |
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T_9 Webinar |
Compact
Model of Single TeraFET
Spectrometer I. Gorbenko, V. Kachorovskii, and Michael Shur A. F. Ioffe, RPI, and Electronics of the Future, Inc. (US) |
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16:00 | End of MOS-AK Workshop | |||||
Extended MOS-AK Committee: | ||||||
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