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Registration: |
On-Line
registration
is available
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11:45-12:00 |
Late News Posters
- Chair: Wladek
Grabinski; GMC
Suisse |
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Extracting parameters for HiSIM HV
1.02 models for state of the art HVMOS and LDMOS devices
Else Schmidt1, Thomas Gneiting2,
1Agilent Technologies, USA, 2AdMOS
GmbH, Germany
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Statistical Model for the
Low-Frequency Noise of MOSFETs under Cyclo-stationary Excitation
Gilson I Wirth, UFRGS
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Recent advances in the ACM model
Osmar Siebel, Marcio C. Schneider and Carlos Galup-Montoro; Federal
University of Santa Catarina, Brazil
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Mask Registration and its Modeling
Implications
David Schwan; RFMD
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