Arbeitskreis
MOS-Modelle und Parameterextraktion MOS Modeling and Parameter Extraction Working Group MOS-AK/GSA Workshop, April 11-12, 2013 Munich |
MOS-AK/GSA Workshop Host and
Sponsors |
Lead Sponsor |
Sponsor |
with the technical program cosponsorship by the IEEE EDS Chapter Germany |
Technical MOS-AK/GSA Program Promoters |
The MOSIS Services |
2nd Announcement
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Venue: |
Lehrstuhl
fur Technische Elektronik
Room: 5325, 5th floor Technische Universitat Munchen Arcisstr. 21 D-80333 Munchen |
Agenda: |
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Registration: | free on-line registration |
Workshop Agenda |
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April 11 | Thursday, Afternoon Session |
13:00 - 16:00 |
Oral
presentations |
Welcome and Workshop Opening Wladek Grabinski; MOS-AK |
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Statistical modeling with backward propagation of variance (BPV) and covariance equations Klaus-Willi Pieper and Elmar Gondro; Infineon Technologies |
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Circuit Sizing with Corner Models Challenges & Applications Matthias Sylvester; MunEDA (D) |
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Compact Modeling Activities in the Framework of the EU-Funded "COMON" Project Benjamin Iñiguez; URV, Tarragona (SP) |
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Effective Device Modeling and Verification Tools Ingo Nickeleit; Agilent Technologies |
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16:00 - 17:00 |
Software/Hardware
Demos |
MunEDA Framework Applications Tanner TSpice Verilog-A Agilent B1505A Power Device Analyzer / Curve Tracer |
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Networking Evening Event | |
April 12 | Friday, Sessions |
9:00 - 12:00 |
Morning Oral Presentations |
Modeling Effects of Dynamic BTI Degradation on Analog and Mixed-Signal CMOS Circuits Leonhard Heiss, Cenk Yilmaz, Christoph Werner, Doris Schmitt-Landsiedel, LTE, TUM (D) |
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STEEPER: Tunnel Field Effect Transistors (TFETs) Technology, Devices and Applications Thomas Schulz and Reinhard Mahnkopf, Intel, IMC, (D) |
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Current and Future Challenges for TCAD Christoph Jungemann and Christoph Zimmermann; RWTH Aachen University (D) |
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Advances in Verilog-A Compact Semiconductor Device Modeling with Qucs/QucsStudio Mike Brinson; London Metropolitan University, London, UK |
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12:00 - 13:00 |
Lunch |
13:00 - 16:00 | Afternoon Oral Presentations |
FDSOI Devices Bentchmarking Bich-Yen Nguyen; SOITEC (F) |
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COMON: SOI Multigate Devices Modeling Alexander Kloes; THM (D) |
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COMON: FinFET Modeling Activities Udit Monga; Intel, IMC, (D) |
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COMON: HV MOS Devices Modeling Matthias Bucher; TUC, (GR) |
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End of the Workshop |
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Committee: | Extended MOS-AK/GSA Committee |
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