Arbeitskreis MOS-Modelle und Parameterextraktion
MOS Modeling and Parameter Extraction Working Group
Compact Modeling for Emerging Technologies

Friday, 22 September 2006 
Montreux Convention and Exhibition Center
Workshop Chair: Dr. W.Grabinski
Technical Program Coordinator: Prof. H.Iwai
  • Morning Session 
    • 9:00-11:00 Oral presentations
    • 10:00-10:30 (coffee break)
  • Poster Session
    • 11:00-12:00 Poster presentations
    • 12:00 - 13:00 (lunch)
  • Afternoon Session
    • 13:00-16:00 Oral presentations
    • 14:30 - 15:00 (coffee break)
Technical Program Promoters
Microswiss IEEE.chSuisse
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Workshop Program
Display Format: Citation Citation & Abstract
9:00-11:00 Morning Session - Chair: Prof. Giorgio Baccarani, UNIBO
  Design and Simulation MOSFET Models: Closing the Gap
Paul Jespers1 and Andrei Vladimirescu2,3
1 Universite Catholique de Louvain 2 University of California, Berkeley 3 Institut Superieur d’Electronique de Paris
  The EKV3 MOS Transistor Model
A. Bazigos, NTUA; M. Bucher, TUC; F. Krummenacher, EPFL
  The PSP compact MOSFET model
R. van Langevelde, G.D.J. Smit, A.J. Scholten, D.B.M. Klaassen
Philips Research Laboratories, Eindhoven, The Netherlands
G. Gildenblat, X. Li, W. Wu, H. Wang and A. Jha
Department of Electrical Engineering, The Arizona State University, Tempe, USA
11:00-12:00 Poster Session - Chair: Prof. Wieslaw Kuzmicz, TU Warsaw and Dr. Gerhard Knoblinger, INFINEON
12:00-13:00 Lunch
13:00-16:00 Afternoon Session - Chair:  Dr. Hisayo S. Momose, TOSHIBA
  Compact model extraction from TCAD
Luca Sponton (ETH), Paul Pfaeffli and Lars Bomholt (Synopsys)
  Advances in 1/f noise modeling: Low frequency gate noise modeling of ultrathin Oxide MOSFETs
Frédéric Martinez and and Matteo Valenza, Université Montpellier II
  Verilog-A: an introduction for compact modelers
Geoffrey Coram, Analog Devices, Inc.
  ADMS: Compact Model Synthesis
PART I: Introduction and development outlook
L. Lemaitre and B. Gu; Freescale
PART II: Extensions and Spectre/UltraSim benchmarking
S. Sukharev, Cadence
  eSIPPs: Enhanced Standard Interconnect Performance Parameters
Judith Mueller and Ertugrul Demircan, Freescale
  Field solver views on constructing compact models for devices in an electromagnetic ambient
Wim Schoenmaker, MAGWEL; Nick van der Meijs, TU Delft; Daniel Ioan, Polytechnical University Bucharest
16:00 End of the workshop
update: 3-Oct-06 (rev.a)
Contents subject to change ©1999-2006 All rights reserved. WG