Arbeitskreis Modellierung von Systemen und Parameterextraktion 
Modeling of Systems and Parameter Extraction Working Group
6th Sino MOS-AK Workshop in Guangzhou (CN)
Aug. 11-12 2022
Calendar
Open Directory
Books
Mission
Committee
MOS-AK: Enabling Compact Modeling R&D Exchange
MOS-AK Workshop Organizers
Jinan_Uni XMOD
MOS-AK Workshop Sponsors (公司,不分先后)
cogenda UESTC Sino_Microtech
Empyrean KouShare
MOS-AK Media Cooperation
Primarius
Final Workshop Program
Important Dates:
  • Call for Papers: Dec. 2021
  • 2nd Announcement: May 2022
  • Final Workshop Program: June 2022
  • 6th Sino MOS-AK Workshop in Guangzhou (CN)
    • Workshop DAY 1, Aug. 11 2022, 9:30 - 17:30
    • Workshop DAY 2, Aug. 12 2022, 9:30 - 17:00
Venue:
Hybrid/Online Event in Guangzhou (CN)
Online registration is open; any related enquiries can be sent to registration@mos-ak.org
Aug. 11 MOS-AK Workshop DAY 1
8:30-9:20 WORKSHOP CHECK IN
9:30-9:35 MOS-AK Opening and Welcome
TBD
Jinan University
9:35-9:40 MOS-AK Review and Outlook
Min Zhang, Wladek Grabinski
XMOD and MOS-AK
9:40-10:25 Highly Effecient Perovskit Solar Cells and Modules (invited talk)
Yaohua Mai
Jinan University
10:25-10:50 Recent Advances in Machine-Learning Based GaN HEMT Modeling
HaoRui Luo
NUS
10:50-11:05 Tea break
11:05-11:50 Designs and Applications of High Temperature SiC Based IPMs (invited talk) DOI: 10.5281/zenodo.7048147
Abel Cao
Cissoid
11:50-12:00 Group photo (offline and online)
12:00-13:30 Lunch
13:30-14:00 TCAD-based Variability-Aware DTCO for Nanosheet Transistors (invited talk)
XingSheng Wang
HUST
14:00-14:25 A surface potential based drain current model of InGaZNO TFTs using an iterative relaxation method
DOI:
10.5281/zenodo.7048162 Fei Yu
Jinan University
14:25-14:50 Extraction of Spice Models for RF switch MOSFET on 0.13um PDSOI-Data and Methods DOI: 10.5281/zenodo.7048209
Rapahel Valentin
XYTech
14:50-15:10 Tea break
15:10-15:55 Quality of Life (QoL) Improvement for Semiconductor-based Systems (invited talk)
Subrat Mishra
IMEC
15:55-16:20 Modeling and Parameter Extraction of SiGe HBTs at Cryogenic Temperatures using Open-Source Tools DMT and VerilogAE
DOI: 10.5281/zenodo.7004861
XiaoDi Jin, M. Müller, M. Krattenmacher, P. Kuthe, C. Weimer and M. Schröter
SemiMod
16:20-16:45 Characterization and modeling of self-heating effect and trapping effect in GaN Devices
WenTao Huang
Sino Microtech
16:45-17:00 MOS-AK Platform Resources
Wladek Grabinski
MOS-AK (EU)
18:00-20:00 Dinner based on local situation
Aug. 12 MOS-AK Workshop DAY 2
8:30-9:20 WORKSHOP CHECK IN
9:30-10:15 DCTO method for RF EDA (invited talk) DOI: 10.5281/zenodo.7048473
Yuehang Xu
UESTC (CN)
10:15-10:40 CNTFET-based HF electronics: State-of-the-art and future prospects (from an engineering point of view) (invited talk) DOI: 10.5281/zenodo.7048227
Michael Schroeter
TU Dresden (D)
10:40-10:50 Tea break
10:50-11:35 Measurement challenges towards successful macro-level RF device modeling (invited talk)
Jiangtao Su
Hangzhou Dianzi University
11:35-12:00 Advanced characterization and modelling for reliable-aware DTCO
Zhigang Ji
Primarius and Jiaotong University
12:00-13:30 Lunch
13:30-14:15 Modified Local density of state method for strained silicon with 2D quantum confinment with application in GAA MOSFETs DOI: 10.5281/zenodo.7048425
TangYan Bo
Cogenda
14:15-14:40 A new Spice model for CNTFET Based on the Nano-Model DOI: 10.5281/zenodo.7051612
Jianhui Bu
IMECAS (CN)
14:40-15:05 Study on GaN-Based HEMTs model and PA design
Ziyue Zhao
Xidian University
15:05-15:25 Tea break
15:25-15:50 Overview and latest updates of L-UTSOI, standard model (invited talk) DOI:10.5281/zenodo.7004900
S. Martinie, T. Bedecarrats, O. Rozeau, T. Poiroux
CEA-LETI
15:50-16:15 Aging Effects and Modeling Researches on 22nm FDSOI MOSFETs DOI: 10.5281/zenodo.7048176
Jing Chen
SIMIT
16:15-16:35 Device Physics and Compact modeling of Metal Oxide Thin Film Transistors DOI: 10.5281/zenodo.7048455
WanLing Deng
Jinan University
16:35-16:45 MOS-AK Nanjing 2023 Planning
End of 6th Sino MOS-AK Workshop
International MOS-AK Compact Modeling Committee

IEEE Membership
International R&D Advisory Board

Larry Nagel, Omega Enterprises Consulting (USA)
Fellow Member
Andrei Vladimirescu, UCB (USA); ISEP (FR)
Fellow Member
MOS-AK Compact Modeling TPC Chair

Wladek Grabinski, MOS-AK (EU)
Senior Member
North America TPC:  
Pekka Ojala, Exar Corporation (USA)
Geoffrey Coram, Analog Devices (USA) Senior Member
Jamal Deen, U.McMaster (CAN)
Fellow Member
Roberto Tinti, Keysight EEsof Division (USA)

open

South America TPC:

Gilson I Wirth, UFRGS (BR)
Senior Memner
Sergio Bampi, UFRGS (BR)
Member
Antonio Cerdeira Altuzarra, Cinvestav-IPN (MX)
Senior Member
Roberto S. Murphy, INAOE (MX) Senior Member
open
Europe TPC:
Ehrenfried Seebacher, ams AG (A) .
Thomas Gneiting, AdMOS (D)
Benjamin Iniguez, URV (SP) Fellow Member
Daniel Tomaszewski, IMiF Warsaw (PL) Senior Member
open
Asia/Pacific TPC:
Sadayuki Yoshitomi, Kioxia (J) Member
Min Zhang, XMOD, Shanghai (CN)
Kaikai Xu, UESTC Chengdu (CN) Senior Member
open
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update: July 2022  (rev:f)
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