| Arbeitskreis Modellierung von Systemen und
Parameterextraktion Modeling of Systems and Parameter Extraction Working Group 6th Sino MOS-AK Workshop in Guangzhou (CN) Aug. 11-12 2022 |
| Calendar |
Open
Directory |
Books |
Mission |
Committee |
MOS-AK:
Enabling Compact Modeling R&D
Exchange
| MOS-AK Workshop Organizers |
 |
 |
| MOS-AK Workshop Sponsors （公司，不分先后） |
 |
 |
 |
 |
 MOS-AK Media Cooperation |
 |
| Final Workshop Program |
| Important Dates: |
|
|
Venue: |
Hybrid/Online Event in Guangzhou (CN) |
| Online | registration is open; any related enquiries can be sent to registration@mos-ak.org |
| Aug. 11 | MOS-AK Workshop DAY 1 |
| 8:30-9:20 |
WORKSHOP CHECK IN |
| 9:30-9:35 |
MOS-AK Opening and Welcome TBD Jinan University |
| 9:35-9:40 |
MOS-AK Review and Outlook Min Zhang, Wladek Grabinski XMOD and MOS-AK |
| 9:40-10:25 |
Highly Effecient Perovskit Solar Cells and Modules (invited talk) Yaohua Mai Jinan University |
| 10:25-10:50 |
Recent Advances in Machine-Learning
Based GaN HEMT Modeling HaoRui Luo NUS |
| 10:50-11:05 |
Tea break |
| 11:05-11:50 |
Designs and Applications of High
Temperature SiC Based IPMs (invited
talk) DOI: 10.5281/zenodo.7048147 Abel Cao Cissoid |
| 11:50-12:00 |
Group photo (offline and online) |
| 12:00-13:30 |
Lunch |
| 13:30-14:00 |
TCAD-based Variability-Aware DTCO
for Nanosheet Transistors (invited
talk) XingSheng Wang HUST |
| 14:00-14:25 |
A surface potential based drain
current model of InGaZNO TFTs using an iterative relaxation method DOI:10.5281/zenodo.7048162 Fei Yu Jinan University |
| 14:25-14:50 |
Extraction of Spice Models for RF
switch MOSFET on 0.13um PDSOI-Data and Methods DOI: 10.5281/zenodo.7048209 Rapahel Valentin XYTech |
| 14:50-15:10 |
Tea break |
| 15:10-15:55 |
Quality of Life (QoL) Improvement
for Semiconductor-based Systems (invited
talk) Subrat Mishra IMEC |
| 15:55-16:20 |
Modeling and Parameter Extraction of SiGe HBTs at Cryogenic Temperatures using Open-Source Tools DMT and VerilogAE DOI: 10.5281/zenodo.7004861 XiaoDi Jin, M. Müller, M. Krattenmacher, P. Kuthe, C. Weimer and M. Schröter SemiMod |
| 16:20-16:45 |
Characterization and modeling of
self-heating effect and trapping effect in GaN Devices WenTao Huang Sino Microtech |
| 16:45-17:00 |
MOS-AK Platform Resources Wladek Grabinski MOS-AK (EU) |
| 18:00-20:00 |
Dinner based on local situation |
| Aug. 12 | MOS-AK Workshop DAY 2 |
| 8:30-9:20 |
WORKSHOP CHECK IN |
| 9:30-10:15 |
DCTO method for RF EDA (invited
talk) DOI: 10.5281/zenodo.7048473 Yuehang Xu UESTC (CN) |
| 10:15-10:40 |
CNTFET-based HF electronics:
State-of-the-art and future prospects (from an engineering point of
view) (invited talk) DOI: 10.5281/zenodo.7048227 Michael Schroeter TU Dresden (D) |
| 10:40-10:50 |
Tea break |
| 10:50-11:35 |
Measurement challenges towards
successful macro-level RF device modeling (invited
talk) Jiangtao Su Hangzhou Dianzi University |
| 11:35-12:00 |
Advanced characterization and
modelling for reliable-aware DTCO Zhigang Ji Primarius and Jiaotong University |
| 12:00-13:30 |
Lunch |
| 13:30-14:15 |
Modified Local density of state
method for strained silicon with 2D quantum confinment with application
in GAA MOSFETs DOI: 10.5281/zenodo.7048425 TangYan Bo Cogenda |
| 14:15-14:40 |
A new Spice model for CNTFET Based on the Nano-Model DOI: 10.5281/zenodo.7051612 Jianhui Bu IMECAS (CN) |
| 14:40-15:05 |
Study on GaN-Based HEMTs model and
PA design Ziyue Zhao Xidian University |
| 15:05-15:25 |
Tea break |
| 15:25-15:50 |
Overview and latest updates of
L-UTSOI, standard model (invited
talk) DOI:10.5281/zenodo.7004900 S. Martinie, T. Bedecarrats, O. Rozeau, T. Poiroux CEA-LETI |
| 15:50-16:15 |
Aging Effects and Modeling
Researches on 22nm FDSOI MOSFETs DOI: 10.5281/zenodo.7048176 Jing Chen SIMIT |
| 16:15-16:35 |
Device Physics and Compact modeling
of Metal Oxide Thin Film Transistors DOI: 10.5281/zenodo.7048455 WanLing Deng Jinan University |
| 16:35-16:45 |
MOS-AK Nanjing 2023 Planning |
| End | of 6th Sino MOS-AK Workshop |
|
|
| IEEE Membership | |
| International
R&D
Advisory Board |
|
| Larry Nagel,
Omega Enterprises Consulting (USA) |
Fellow Member |
| Andrei
Vladimirescu, UCB (USA); ISEP (FR) |
Fellow Member |
| MOS-AK
Compact Modeling TPC Chair |
|
| Wladek
Grabinski, MOS-AK (EU) |
Senior Member |
| North America TPC: | |
| Pekka Ojala, Exar (USA) | |
| Geoffrey Coram, Analog Devices (USA) | Senior Member |
| Jamal Deen, U.McMaster (CAN) |
Fellow Member |
| Roberto Tinti, Keysight EEsof Division (USA) |
|
| open |
|
| South America TPC: |
|
| Gilson I Wirth, UFRGS (BR) |
Senior Memner |
| Sergio Bampi, UFRGS (BR) |
Member |
| Antonio Cerdeira Altuzarra, Cinvestav-IPN (MX) |
Senior Member |
| Roberto S. Murphy, INAOE (MX) | Senior Member |
| open | |
| Europe TPC: | |
| Ehrenfried Seebacher, ams AG (A) | . |
| Thomas Gneiting, AdMOS (D) | |
| Benjamin Iniguez, URV (SP) | Fellow Member |
| Daniel Tomaszewski, IMiF Warsaw (PL) | Senior Member |
| open | |
| Asia/Pacific TPC: | |
| Sadayuki Yoshitomi, Kioxia (J) | Member |
| Rakesh Vaid, University of Jammu (IN) | Senior Member |
| Min Zhang, XMOD, Shanghai (CN) | |
| Yuehang Xu, UESTC Chengdu (CN) |
|
| Kaikai Xu, UESTC Chengdu (CN) | Senior Member |
|
|
|
|
Graphics (C) 2022 Oliver