Arbeitskreis
MOS-Modelle und Parameterextraktion MOS Modeling and Parameter Extraction Working Group MOS-AK Meeting Friday, 4 April 2008 at MiPlaza, High Tech Campus Eindhoven |
Sponsors of the MOS-AK Meeting |
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Technical Program Promoters |
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Agenda: Friday, 4 April 2008 at MiPlaza, High Tech Campus Eindhoven | ||
Workshop
Chair: Thomas Gneiting
Technical Program Coordinator: W.Grabinski |
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Poster Session Program | ||||||
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11:30 | Poster Session Briefing |
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Enabling High Certainty 1/f
Measurements at Higher Corner Frequencies Anthony Lord (Cascade Microtech Europe Ltd) |
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Next-Generation Device-Level Model
Extraction and Generation Solutions Tim K. Smith and James Ashforth-Pook (Accelicon Technologies) |
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LDMOS modeling in HV-CMOS Technology Ehrenfried Seebacher, Werner Posch, Biswanath Senapati, Kund Molnar and Alexander Steinmair (austriamicrosystems) |
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Compact Small-Signal Modelling of
Multiple-Gate Mosfets up to RF Operation Benjamin Iñiguez*, Antonio Lázaro*, Oana Moldovan*, Bogdan Nae* and Hamdy A. Hamid**; (*Uni Tarragona, **Uni Ontario) |
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Compact Modeling of Nanoscale
Multiple-Gate FETs Alexander Kloes*, Michaela Weidemann* ** (*Uni.Giessen-Friedberg, **Uni.Tarragona) |
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Design-oriented Compact Model for
FinFET Mingchun Tang*, Fabien Prégaldiny*, Christophe Lallement*, Jean-Michel Sallese** and François Krummenacher* (*InESS /ENSPS, *EPFL/IMM) |
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A CMOS Technology and its
Characterization in ITE Tomasz Bieniek*, Krzysztof Kucharski*, Lidia Lukasiak**, Arkadiusz Malinowski*, Dariusz Obrebski* and Daniel Tomaszewski* (*ITE Warsaw **IMIO PW) |
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Self-consistent 2D modeling of
Short-channel Nanoscale DG and GAA MOSFETs H. Børli and T.A. Fjeldly (UNIK) |
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Fully Automatic Extraction of OTFT
Transistor Parameters Using Improved Genetic Algortihms M.A. Calafat*,**, R. Picos*, M. Fernandez**, M. Roca*, B. Iniguez***, E. Garcia-Moreno* (*GTE Universitat Illes Balears, **Universidad de Oviedo ***DEEEA Universitat Rovira i Virgili ) |
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Accurate FinFET Modeling at High
Temperatures A. Cerdeira*, M. Estrada*, J. Alvarado*, V. Kilchytska** and D. Flandre* (*CINVESTAV, **CUL) |
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RF Extraction Techniques for Series
Resistances of MOSFETs: Major Concerns J. C. Tinoco and J.-P. Raskin (UCL) |
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12:00 | End of the Poster Session |
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